Comparison ledger
Accretech APM 90, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | APM 90Accretech | |
|---|---|---|
| OEM | Accretech | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Accretech APM 90 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | Nickle Chuck[1] | — |
| Temp range | 25-150 grad[1] | — |
| Missing | Joystick, Display, HDD, Cleaning Unit Ceramic[2] | — |
| Wafer Sizes | 6, 8 inch[1] | — |
| Chuck Material | Nickel[1] | — |
| Temperature Range | 25-150 °C[1] | -68°C to +180°C[4] |
| Loader Type | Single loader[1] | — |
| Chuck Planarity | ~19 µm[1] | — |
| Equipment type | Prober[1] | — |
| Wafer sizes | 6 inch, 8 inch[1] | — |
| Chuck | Nickle Chuck[1] | — |
| Temperature range | 25-150 grad[1] | — |
| Loader | Single loader[1] | — |
| OCR | Includes OCR[3] | — |
| Vintage | 1995, 1996, 1997[2] | — |
| Chamber Size | — | 1.2 cubic feet[4] |
| Control | — | +/-1.0°C[4] |
| Manufacturer | — | Tenney[4] |
| Model | — | JR-A-F4T[4] |
| Short description | — | Junior compact temperature test chambers[4] |
| Control accuracy | — | +/-1.0°C[4] |
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