Comparison ledger
Accretech UF 3000 EX-e, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | UF 3000 EX-eAccretech | |
|---|---|---|
| OEM | Accretech | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Accretech UF 3000 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | Dual-temp DD 93K[1] | — |
| Temperature capability | Dual-temp DD 93K[1] | — |
| Chuck type | Low noise hot chuck[2] | — |
| Cleaning unit size | 150 x 160mm[2] | — |
| Probe card interface | T 2000 ISS 64PARA 440mm Card[2] | — |
| Tester interface | MHF 6000[2] | — |
| Interface type | GPIB, Ethernet, Remote SS UI[2] | — |
| Option | FFU (Fan Filter Unit)[2] | — |
| Power supply | Single Phase[2] | — |
| Chamber Size | — | 1.2 cubic feet[3] |
| Temperature Range | — | -68°C to +180°C[3] |
| Control | — | +/-1.0°C[3] |
| Manufacturer | — | Tenney[3] |
| Model | — | JR-A-F4T[3] |
| Short description | — | Junior compact temperature test chambers[3] |
| Control accuracy | — | +/-1.0°C[3] |
Plan your fab
Building a Test & Probe process? Get a complete equipment list.
Open the fab equipment planner →