Comparison ledger
Advantest 93000 SOC C 200 e, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 93000 SOC C 200 eAdvantest | |
|---|---|---|
| OEM | Advantest | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest 93000 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | XW4400 *1[1] | — |
| Configuration (Asset #150848) | XW4400 *1, C400e/C200e *32, GPDSP *4, 2004 Vintage[1] | — |
| Configuration (Asset #150847) | XW8400 *1, C400e/C200e *46, MCA *2, MSDPS *5, 2005 Vintage[2] | — |
| Configuration (Asset #150846) | XW8400 *1, C400e/C200e *32, MCA *2, MSDPS *5, 2004 Vintage[3] | — |
| Chamber Size | — | 1.2 cubic feet[4] |
| Temperature Range | — | -68°C to +180°C[4] |
| Control | — | +/-1.0°C[4] |
| Manufacturer | — | Tenney[4] |
| Model | — | JR-A-F4T[4] |
| Short description | — | Junior compact temperature test chambers[4] |
| Control accuracy | — | +/-1.0°C[4] |
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