Comparison ledger
Advantest HP / Verigy PS 1600 Smartscale, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | HP / Verigy PS 1600 SmartscaleAdvantest | |
|---|---|---|
| OEM | Advantest | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | 2012 Vintage year | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest HP / Verigy PS 1600 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | PS 1600 B (x2)[1] | — |
| Make | Advantest / Agilent / HP / Verigy[1] | — |
| Model | PS 1600[1] | JR-A-F4T[3] |
| Component: PS 1600 | 2[1] | — |
| Component: DPS 32 | 2[1] | — |
| Component: CTH (Compact Test Head) | 1[1] | — |
| Component: HP Z620 workstation | 1[1] | — |
| Component: RFE-A | 2[1] | — |
| Component: RFF-A | 2[1] | — |
| Vintage | 2012[2] | — |
| Category | Test & Probe[2] | — |
| Type | semiconductor test system[2] | — |
| Included components | PS 1600 modules, DPS 32 units, Compact Test Head (CTH), HP Z620 workstation, RFE-A modules, RFF-A modules[2] | — |
| Chamber Size | — | 1.2 cubic feet[3] |
| Temperature Range | — | -68°C to +180°C[3] |
| Control | — | +/-1.0°C[3] |
| Manufacturer | — | Tenney[3] |
| Short description | — | Junior compact temperature test chambers[3] |
| Control accuracy | — | +/-1.0°C[3] |
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