Comparison ledger
Advantest M 6242, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | M 6242Advantest | |
|---|---|---|
| OEM | Advantest | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest M 6242 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | 50 / 60 Hz[1] | — |
| Target Packages | BGA, CSP, TSOP 1[2] | — |
| Simultaneous Testing | Up to 512 devices[2] | — |
| Throughput | 42,300 devices per hour[1] | — |
| Temperature Range | -40°C to 125°C, -55°C to 125°C (optional)[1] | -68°C to +180°C[4] |
| Match Plate | Advantest Standard Type[1] | — |
| Product type | Dynamic test handler[3] | — |
| Application | Mass-production DRAM[2] | — |
| Temperature range | -40°C to +125°C[2] | — |
| Optional temperature range | -55°C to +125°C[2] | — |
| Power frequency | 50 / 60 Hz[1] | — |
| Match plate | Advantest Standard Type 2018 Vintage[1] | — |
| Chamber Size | — | 1.2 cubic feet[4] |
| Control | — | +/-1.0°C[4] |
| Manufacturer | — | Tenney[4] |
| Model | — | JR-A-F4T[4] |
| Short description | — | Junior compact temperature test chambers[4] |
| Control accuracy | — | +/-1.0°C[4] |
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