Comparison ledger
Advantest M 6751 A, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | M 6751 AAdvantest | |
|---|---|---|
| OEM | Advantest | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest M 6751 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | parts machines[1] | — |
| Handler Type | Dynamic test handler[2] | — |
| Y2K Readiness Software Revision | 1.00[2] | — |
| Y2K Software Revision | 1.00[2] | — |
| Manufacturer | Advantest[3] | Tenney[4] |
| Model | M 6751 A[3] | JR-A-F4T[4] |
| Equipment type | Handler[3] | — |
| Category listing | Dynamic Test Handlers[2] | — |
| Year 2000 readiness | Year 2000 ready from 1.00[2] | — |
| Chamber Size | — | 1.2 cubic feet[4] |
| Temperature Range | — | -68°C to +180°C[4] |
| Control | — | +/-1.0°C[4] |
| Short description | — | Junior compact temperature test chambers[4] |
| Control accuracy | — | +/-1.0°C[4] |
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