Comparison ledger
Advantest PS 400, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | PS 400Advantest | |
|---|---|---|
| OEM | Advantest | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest PS 400 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Cited variants |
| — |
| Specifications | ||
| Configuration | 1 CTH 1/STH:2/ATH:1[2] | — |
| Compact Test Head | CTH[1] | — |
| Workstation | HP Z 800[1] | — |
| Card/Board | PS 400 (4x)[1] | — |
| DPS 32 | 2x[1] | — |
| MCB | 1x[1] | — |
| RFE | 2x[1] | — |
| RFF | 2x[1] | — |
| Chiller | E 2760 FA[1] | — |
| Operating System | Dual OS: Redhat 5.6 & 5.8[1] | — |
| Software Version Redhat 5.6 | SMT 6.5.3; 6.5.4: 7.1.2.3[1] | — |
| Software Version Redhat 5.8 | SMT 7.1.2.3; 7.2.0.9; 7.2.3.0[1] | — |
| Make | Advantest[3] | — |
| Model | PS 400[3] | JR-A-F4T[4] |
| Category | Test & Probe[2] | — |
| Equipment name | Advantest V 93000 PS 400 Tester[2] | — |
| Tool type | semiconductor test system[1] | — |
| Software version | Redhat 5.6: SMT 6.5.3; 6.5.4: 7.1.2.3[1] | — |
| Chamber Size | — | 1.2 cubic feet[4] |
| Temperature Range | — | -68°C to +180°C[4] |
| Control | — | +/-1.0°C[4] |
| Manufacturer | — | Tenney[4] |
| Short description | — | Junior compact temperature test chambers[4] |
| Control accuracy | — | +/-1.0°C[4] |
Plan your fab
Building a Test & Probe process? Get a complete equipment list.
Open the fab equipment planner →