Comparison ledger
Advantest T 2000 EEP (SP 2), Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | T 2000 EEP (SP 2)Advantest | |
|---|---|---|
| OEM | Advantest | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest T 2000 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | Module Information:[1] | — |
| Module | SGM208, Slot: 56, Bus: 24, Channel 1 - 128[1] | — |
| OEM | Advantest[2] | — |
| Model | T 2000 EEP (SP 2)[2] | JR-A-F4T[3] |
| Equipment type | Tester[2] | — |
| Category | Test & Probe[2] | — |
| Module information | SGM208, Slot 56, Bus 24, Channel 1-128; CUTI, Slot 1, Bus 1, Channel 1-256; RC5V192E, Slot 27, Bus 10, Channel 1-129; PMU32E, Slot 44, Bus 29, Channel 1-132; DM2GBPSE, Slot 9, Bus 6, Channel 1-256; DM2GBPSE, Slot 10, Bus 7, Channel 257-512; DM2GBPSE, Slot 35, Bus 13, Channel 513-768; DM2GBPSE, Slot 36, Bus 14, Channel 769-1024; DM2GBPSE, Slot 17, Bus 21, Channel 1025-1280; DM2GBPSE, Slot 16, Bus 22, Channel 1281-1536; DM2GBPSE, Slot 43, Bus 30, Channel 1537-1792; DM2GBPSE, Slot 42, Bus 31, Channel 1793-2048; DPS192A, Slot 3, Bus 2, Channel 1-96; DPS192A, Slot 24, Bus 17, Channel 97-192; DPS192A, Slot 50, Bus 26, Channel 193-288[1] | — |
| Chamber Size | — | 1.2 cubic feet[3] |
| Temperature Range | — | -68°C to +180°C[3] |
| Control | — | +/-1.0°C[3] |
| Manufacturer | — | Tenney[3] |
| Short description | — | Junior compact temperature test chambers[3] |
| Control accuracy | — | +/-1.0°C[3] |
Plan your fab
Building a Test & Probe process? Get a complete equipment list.
Open the fab equipment planner →