Comparison ledger
Advantest T 5371, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | T 5371Advantest | |
|---|---|---|
| OEM | Advantest | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest T 5371 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | For Parts[1] | — |
| Device types | DRAM, SDRAM, CDRAM, SRAM, Flash memory, Direct RDRAM, EPROM, masked ROM[2] | — |
| Test frequency | 70 MHz[2] | — |
| Timing accuracy | 800 ps[2] | — |
| Maximum channels | 128[2] | — |
| Test head | up to 2 stations, HV drive option[2] | — |
| Timing patterns | 27 timing edges/row, 16 timing sets/row[2] | — |
| Pattern format | ALPG 16X, 16Y, 18D x 2[2] | — |
| DC test unit | up to 32 units[2] | — |
| Programmer units | up to 128 units[2] | — |
| Attachments | 36 Files[3] | — |
| Chamber Size | — | 1.2 cubic feet[4] |
| Temperature Range | — | -68°C to +180°C[4] |
| Control | — | +/-1.0°C[4] |
| Manufacturer | — | Tenney[4] |
| Model | — | JR-A-F4T[4] |
| Short description | — | Junior compact temperature test chambers[4] |
| Control accuracy | — | +/-1.0°C[4] |
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