Comparison ledger
Advantest T 5372, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | T 5372Advantest | |
|---|---|---|
| OEM | Advantest | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest T 5372 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | Parts machines[1] | — |
| Test speed | 143MHz/286MHz (DDR mode)[3] | — |
| Max test pins | 128 (64×2 stations ×8/×9 bit)[3] | — |
| Max test heads (stations) | 2[3] | — |
| DC units per station | 32[3] | — |
| Programmable loads per station | 128[3] | — |
| Options | MRA4 ev2, FM, Fail Bit Compress Engine[3] | — |
| Supported devices | DRAM, SDRAM, DDR devices, SRAM, Flash memories, Direct RDRAM, EPROM, Mask ROM, etc.[3] | — |
| Maximum pins | 128 (64 x 2 stations x 8/9 bit)[3] | — |
| Maximum test head stations | 2[3] | — |
| High voltage/drive (DC nets per station) | 32 max[3] | — |
| Programmable power supplies per station | 128 max[3] | — |
| Make | Advantest[1] | — |
| Model | T 5372[1] | JR-A-F4T[4] |
| Equipment type | Tester[1] | — |
| Chamber Size | — | 1.2 cubic feet[4] |
| Temperature Range | — | -68°C to +180°C[4] |
| Control | — | +/-1.0°C[4] |
| Manufacturer | — | Tenney[4] |
| Short description | — | Junior compact temperature test chambers[4] |
| Control accuracy | — | +/-1.0°C[4] |
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