Comparison ledger
Advantest T 5377 S, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | T 5377 SAdvantest | |
|---|---|---|
| OEM | Advantest | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest T 5377 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Cited variants |
| — |
| Specifications | ||
| Configuration | 2048DR +1280 I/O[2] | — |
| Memory capacity | 16G FMRA[2] | — |
| Handler interface | WMB Hifix[2] | — |
| Vintage | 2006, 2007[2] | — |
| Digital Resources (DR) | 2048[2] | — |
| I/O channels | 1280[2] | — |
| FMRA | 16G[2] | — |
| Hifix | WMB[2] | — |
| Vintage years | 2006, 2007[2] | — |
| Product category | Memory Test System[1] | — |
| Make | Advantest[2] | — |
| Model | T 5377 S[2] | JR-A-F4T[3] |
| Equipment type | Tester[2] | — |
| Chamber Size | — | 1.2 cubic feet[3] |
| Temperature Range | — | -68°C to +180°C[3] |
| Control | — | +/-1.0°C[3] |
| Manufacturer | — | Tenney[3] |
| Short description | — | Junior compact temperature test chambers[3] |
| Control accuracy | — | +/-1.0°C[3] |
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