Comparison ledger
Advantest T 5588, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | T 5588Advantest | |
|---|---|---|
| OEM | Advantest | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest T 5588 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | (4) Bays[1] | — |
| Frequency | 800 MHz[1] | — |
| Test Speed | 400 MHz / 800 Mbps[2] | — |
| Maximum Devices per System | 512[2] | — |
| Target Devices | DDR2-SDRAM, Flash memory[2] | — |
| Operating System | FutureSuite (multi-threaded)[2] | — |
| Number of Test Heads | 1[1] | — |
| Number of Bays | 4[1] | — |
| Maximum Frequency | 800 MHz[1] | — |
| IO Channels | 3072[1] | — |
| DR Channels | 3584[1] | — |
| PPS Channels | 512[1] | — |
| DC Channels | 64[1] | — |
| Vintage | 2010[3] | — |
| Model | T 5588[1] | JR-A-F4T[5] |
| Head frequency | 800 MHz[1] | — |
| I/O channels | 3072 IO channels[1] | — |
| DR channels | 3584 DR channels[1] | — |
| PPS channels | 512 PPS channels[1] | — |
| DC channels | 64 DC channels[1] | — |
| Maximum testing rate | 800 Mbps[4] | — |
| Simultaneous testing | Up to 512 devices per system[4] | — |
| Target devices | DDR2-SDRAMs, FLASH memories[4] | — |
| Operating system | FutureSuite[3] | — |
| Chamber Size | — | 1.2 cubic feet[5] |
| Temperature Range | — | -68°C to +180°C[5] |
| Control | — | +/-1.0°C[5] |
| Manufacturer | — | Tenney[5] |
| Short description | — | Junior compact temperature test chambers[5] |
| Control accuracy | — | +/-1.0°C[5] |
Plan your fab
Building a Test & Probe process? Get a complete equipment list.
Open the fab equipment planner →