Comparison ledger
Advantest T 5835 Memory, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | T 5835 MemoryAdvantest | |
|---|---|---|
| OEM | Advantest | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest T 5835 Memory | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | Power & Cooling cabinet[1] | — |
| Phase | 3 Phase[1] | — |
| Type | Memory test system[2] | — |
| Target devices | DRAM, NAND Flash[2] | — |
| Operating speed | Up to 5.4 Gbps[2] | — |
| Parallel testing | Final test: 512/768[2] | — |
| Overall timing accuracy | ±50ps[2] | — |
| Software | FutureSuite OS (ATL and MPAT compatible)[2] | — |
| Configuration options | STH (Small Test Head), LTH (Large Test Head), MTH (Middle Test Head)[2] | — |
| Chamber Size | — | 1.2 cubic feet[3] |
| Temperature Range | — | -68°C to +180°C[3] |
| Control | — | +/-1.0°C[3] |
| Manufacturer | — | Tenney[3] |
| Model | — | JR-A-F4T[3] |
| Short description | — | Junior compact temperature test chambers[3] |
| Control accuracy | — | +/-1.0°C[3] |
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