Comparison ledger
Advantest V 93000 C (2 CC) DUT Test Head, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | V 93000 C (2 CC) DUT Test HeadAdvantest | |
|---|---|---|
| OEM | Advantest | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest V 93000 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Cited variants | — | |
| Specifications | ||
| Configuration | Rev 004[3] | — |
| Digital Cards | HSM8G x2, Digital pPogos: HD256 x2[3] | — |
| DPS Cards | DCS-DPS32 x1, DCS-VI32 x1, (Missing E5810 LAN/GPIB Gateway)[3] | — |
| Digital cards | HSM8G x2, digital pogos: HD256 x2[4] | — |
| DPS cards | DCS-VI32 x1[4] | — |
| Revision | 004 / 005[3] | — |
| Digital Pogos | HD256 x2 (Rev 004), x3 (Rev 005)[2] | — |
| CTH Engineering Cart | Included[3] | — |
| Control Workstation | Included[3] | — |
| OEM | Advantest[3] | — |
| Model | V 93000 C (2 CC)[3] | JR-A-F4T[5] |
| Equipment type | DUT Test Head[3] | — |
| Digital pogos | HD256 x2[3] | — |
| Included items | CTH engineering cart; control workstation[3] | — |
| Engineering cart | CTH engineering cart[3] | — |
| Chamber Size | — | 1.2 cubic feet[5] |
| Temperature Range | — | -68°C to +180°C[5] |
| Control | — | +/-1.0°C[5] |
| Manufacturer | — | Tenney[5] |
| Short description | — | Junior compact temperature test chambers[5] |
| Control accuracy | — | +/-1.0°C[5] |
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