Comparison ledger
Advantest V 93000 PS 400, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | V 93000 PS 400Advantest | |
|---|---|---|
| OEM | Advantest | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest V 93000 PS 400 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| CTH | 1/STH:2/ATH:1[1] | — |
| Make | Advantest[1] | — |
| Model | V 93000 PS 400[1] | JR-A-F4T[4] |
| Tool type | semiconductor test system[2] | — |
| Category | Test & Probe[2] | — |
| Test head | CTH - Compact Test Head[2] | — |
| Card/Board | PS 400 (4x)[2] | — |
| Operating system | Dual OS: Redhat 5.6 & 5.8[2] | — |
| Software version Redhat 5.6 | SMT 6.5.3; 6.5.4: 7.1.2.3[2] | — |
| Software version Redhat 5.8 | SMT 7.1.2.3; 7.2.0.9; 7.2.3.0[2] | — |
| Workstation | HP Z 800[2] | — |
| Configuration & options | CTH 1/STH:2/ATH:1[3] | — |
| Chamber Size | — | 1.2 cubic feet[4] |
| Temperature Range | — | -68°C to +180°C[4] |
| Control | — | +/-1.0°C[4] |
| Manufacturer | — | Tenney[4] |
| Short description | — | Junior compact temperature test chambers[4] |
| Control accuracy | — | +/-1.0°C[4] |
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