Comparison ledger
Agilent 3325 A Function, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 3325 A FunctionAgilent | |
|---|---|---|
| OEM | Agilent | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Agilent 33xx | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Line | 50/60 Hz[1] | — |
| Voltage | 100/120/220/240 V[1] | — |
| Current | 450 Va Max[1] | — |
| Configuration | Option 2[1] | — |
| Manufacturer | Agilent[1] | Tenney[4] |
| Model | 3325 A[1] | JR-A-F4T[4] |
| Tool type | Function generator[2] | — |
| Category | Test & Probe[2] | — |
| Option | Option 2[1] | — |
| Publication year of manual | 1984[3] | — |
| Chamber Size | — | 1.2 cubic feet[4] |
| Temperature Range | — | -68°C to +180°C[4] |
| Control | — | +/-1.0°C[4] |
| Short description | — | Junior compact temperature test chambers[4] |
| Control accuracy | — | +/-1.0°C[4] |
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