Comparison ledger
Agilent 3784 A Digital Transmission Analyzer, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | ||
|---|---|---|
| OEM | Agilent | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Agilent 3784 A Digital Transmission Analyzer | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | Tabletop[1] | — |
| Measurement capability | G.821 error analysis at 704 kb/s, 2, 8, and 34 Mb/s[2] | — |
| Optional feature | Optional jitter generation and measurement at 2, 8, and 34 Mb/s (Option 002)[2] | — |
| Clock synthesizer range | Between 1 kb/s and 50 Mb/s[2] | — |
| Chamber Size | — | 1.2 cubic feet[3] |
| Temperature Range | — | -68°C to +180°C[3] |
| Control | — | +/-1.0°C[3] |
| Manufacturer | — | Tenney[3] |
| Model | — | JR-A-F4T[3] |
| Short description | — | Junior compact temperature test chambers[3] |
| Control accuracy | — | +/-1.0°C[3] |
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