Comparison ledger
Agilent 8703 A Lightwave Component Analyzer, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | ||
|---|---|---|
| OEM | Agilent | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Agilent 87xx | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Cited variants | — | |
| Specifications | ||
| Configuration | For parts[2] | — |
| Type | Lightwave Component Analyzer[2] | — |
| Model | 8703 A[2] | JR-A-F4T[3] |
| Modulation bandwidth | 130 MHz to 20 GHz[1] | — |
| Measured domains | Optical, electrical, and electro-optical[1] | — |
| Frequency coverage | 0.13 to 20 GHz[1] | — |
| Internal source wavelengths | 1308 nm or 1550 nm, ±10 nm[1] | — |
| Connector types | Lightwave: HMS-10, FC/PC, DIN 47256, ST, Biconic, SC; Microwave: 3.5 mm (male)[1] | — |
| Chamber Size | — | 1.2 cubic feet[3] |
| Temperature Range | — | -68°C to +180°C[3] |
| Control | — | +/-1.0°C[3] |
| Manufacturer | — | Tenney[3] |
| Short description | — | Junior compact temperature test chambers[3] |
| Control accuracy | — | +/-1.0°C[3] |
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