Comparison ledger
Agilent Medalist i 3070 ICT, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Medalist i 3070 ICTAgilent | |
|---|---|---|
| OEM | Agilent | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Agilent Medalist i 3070 ICT | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | Series II upgrade to Series III[1] | — |
| Manufacturer | Agilent[2] | Tenney[3] |
| Category | Test & Probe[2] | — |
| Type | in-circuit tester[2] | — |
| Modules | 2 modules with E 4025 A Test Head[1] | — |
| Configuration detail | ASRU C configuration[1] | — |
| Density | 4 Hybrid standard double density[1] | — |
| Chamber Size | — | 1.2 cubic feet[3] |
| Temperature Range | — | -68°C to +180°C[3] |
| Control | — | +/-1.0°C[3] |
| Model | — | JR-A-F4T[3] |
| Short description | — | Junior compact temperature test chambers[3] |
| Control accuracy | — | +/-1.0°C[3] |
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