Comparison ledger
Agilent N 5172 B EXG Vector Signal, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | N 5172 B EXG Vector SignalAgilent | |
|---|---|---|
| OEM | Agilent | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Agilent N 5172 B EXG Vector Signal | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Spec | 9 kHz - 3 GHz[1] | — |
| Firmware Rev | B.01.90[1] | — |
| Firmware Date | Mar 4, 2020[1] | — |
| Operating System | CE 7.0.2882 20190905-0841[1] | — |
| Configuration | Options installed:[1] | — |
| Frequency range | 9 kHz - 3 GHz[1] | — |
| Firmware revision | B.01.90[1] | — |
| Option 021 | Upgrade BBG memory from 32 Msa to 256 Msa[1] | — |
| Option 503 | 3 GHz frequency range[1] | — |
| Option 653 | ARB Baseband Generator (60 MHz RF, 32 Msa)[1] | — |
| Option N7612B-3TP | Connect to N5182/62 MXG, N5172 EXG[1] | — |
| Option N7612B-ETP | Basic TD-SCDMA/HSDPA[1] | — |
| Option N7612B-QTP | Advanced TD-SCDMA/HSDPA[1] | — |
| Chamber Size | — | 1.2 cubic feet[2] |
| Temperature Range | — | -68°C to +180°C[2] |
| Control | — | +/-1.0°C[2] |
| Manufacturer | — | Tenney[2] |
| Model | — | JR-A-F4T[2] |
| Short description | — | Junior compact temperature test chambers[2] |
| Control accuracy | — | +/-1.0°C[2] |
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