Comparison ledger
Applied Materials 0010-03485 Magnet Assy, Veeco profilometer-R1, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-03485 Magnet AssyApplied Materials | profilometer-R1Veeco |
|---|---|---|
| OEM | Applied Materials | Veeco |
| Category | — | — |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0010-03485 Magnet Assy | Veeco profilometer-R1 |
| Specifications | ||
| Configuration | WP AL 300mm PVD[1] | — |
| OEM | Applied Materials[1] | — |
| Model | 0010-03485[1] | Vecco Dektak 150[6] |
| Description | MAGNET ASSY, WP AL 300MM PVD[2] | — |
| Process | PVD[3] | — |
| Wafer size | 300mm[4] | — |
| Version | Spares[4] | — |
| Part Number | 0010-03485[1] | — |
| Manufacturer | Applied Materials[1] | — |
| Process Type | PVD (Physical Vapor Deposition)[1] | — |
| Application (Material) | Aluminum (AL)[1] | — |
| Wafer Diameter (associated) | 300 mm[1] | — |
| Equipment type | — | Stylus profiler[5] |
| Identifier | — | Inert-VEECO-profilometer-R1[5] |
| Vendor | — | Bruker (previously Veeco)[6] |
| Purpose | — | Stylus-based scanning system for measuring surface topography and thin film step heights[6] |
| Sample diameter | — | Up to 200 mm[6] |
| Sample thickness | — | Up to 90 mm[6] |
| Stylus tip | — | 2.5 μm tip[6] |
| Scan length | — | 55 mm[6] |