Comparison ledger
Applied Materials 0010-18024 Pyrometer Assembly, Applied Materials UVision 3 Brightfield, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-18024 Pyrometer AssemblyApplied Materials | UVision 3 BrightfieldApplied Materials |
|---|---|---|
| OEM | Applied Materials | Applied Materials |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0010-18024 Pyrometer Assembly | Applied Materials UVision |
| Specifications | ||
| Configuration | Capable of working on Applied Materials Radiance[1] | Loadport - ASYST Isoport[2] |
| Loading Configuration | — | FOUP, 2 Positions[2] |
| Operating Software | — | Windows XP[3] |
| SW Version | — | 7.5 I[2] |
| Inspection type | — | Brightfield inspection[2] |
| Illumination source | — | DUV (deep ultraviolet) laser[4] |
| Throughput advantage | — | 40% faster than any competitive brightfield inspection tool[4] |
| Defect detection sensitivity | — | 45nm FEOL and immersion lithography[4] |
| Laser architecture | — | Multi-beam DUV laser architecture[4] |
| Wafer size | — | 300mm[5] |
| Loading configuration | — | FOUP-based[3] |
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