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Comparison ledger

0010-21246 Partversusprofilometer-R1

Applied Materials 0010-21246 Part, Veeco profilometer-R1, side by side. Every value shown is drawn from the cited encyclopedia entries.

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Side-by-side comparison of selected equipment models
Attribute
0010-21246 PartApplied Materials
OEMApplied MaterialsVeeco
Category——
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
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Control system——
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Family—Veeco profilometer-R1
Specifications
Equipment type—Stylus profiler[1]
Identifier—Inert-VEECO-profilometer-R1[1]
Vendor—Bruker (previously Veeco)[2]
Model—Vecco Dektak 150[2]
Purpose—Stylus-based scanning system for measuring surface topography and thin film step heights[2]
Sample diameter—Up to 200 mm[2]
Sample thickness—Up to 90 mm[2]
Stylus tip—2.5 μm tip[2]
Scan length—55 mm[2]
Sources (2)Every fact above is drawn from these public sources
  1. [1]uwaterloo.cauwaterloo.ca
  2. [2]uwaterloo.cauwaterloo.ca