Comparison ledger
Applied Materials 0010-22161 High EFF RF Match, Veeco profilometer-R1, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-22161 High EFF RF MatchApplied Materials | profilometer-R1Veeco |
|---|---|---|
| OEM | Applied Materials | Veeco |
| Category | — | — |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0010-22161 High EFF RF Match | Veeco profilometer-R1 |
| Specifications | ||
| Make | Applied Materials[1] | — |
| Model | 0010-22161[1] | Vecco Dektak 150[4] |
| Description | HTESC PH 1 REV A[2] | — |
| Condition | Used[2] | — |
| Stock Number | BM6628[2] | — |
| Equipment type | — | Stylus profiler[3] |
| Identifier | — | Inert-VEECO-profilometer-R1[3] |
| Vendor | — | Bruker (previously Veeco)[4] |
| Purpose | — | Stylus-based scanning system for measuring surface topography and thin film step heights[4] |
| Sample diameter | — | Up to 200 mm[4] |
| Sample thickness | — | Up to 90 mm[4] |
| Stylus tip | — | 2.5 μm tip[4] |
| Scan length | — | 55 mm[4] |