Comparison ledger
Applied Materials 0720 06060 Part, Signatone S-1160, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0720 06060 PartApplied Materials | S-1160Signatone |
|---|---|---|
| OEM | Applied Materials | Signatone |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0720 06060 Part | Signatone S-1160 |
| Cited variants | — | |
| Specifications | ||
| Configuration | Contact Pin 24-20 Awg Crimp Gold Flash[2] | — |
| Optics configuration | — | Can be fitted with either high powered optics or lower powered optics[1] |
| Applications stated | — | RF probing, low current (femtoamp range) probing, failure analysis, thermal probing and other uses[1] |
| Micropositioner compatibility | — | Accepts both magnetic base and vacuum base micropositioners[1] |
| Vacuum ports | — | Equipped with vacuum ports for up to twelve vacuum base micropositioners[1] |
| Equipment type | — | Probe station[1] |
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