Comparison ledger
Applied Materials 0720 06060 Part, Teradyne Nextest Magnum I SSV, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0720 06060 PartApplied Materials | Nextest Magnum I SSVTeradyne |
|---|---|---|
| OEM | Applied Materials | Teradyne |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0720 06060 Part | Teradyne Nextest Magnum I SSV |
| Specifications | ||
| Configuration | Contact Pin 24-20 Awg Crimp Gold Flash[1] | — |
| Maximum Test Stations | — | 16[2] |
| Supported Test Modes | — | Automatic, manual, analog, and script-based[2] |
| Safety Features | — | Lockable cover and smart power management[2] |
| Diagnostics and Optimization | — | Advanced diagnostic functions and optimization algorithms[2] |
Plan your fab
Building a Test & Probe process? Get a complete equipment list.
Open the fab equipment planner →