Comparison ledger
ASM ADL 838 L G 2 Dual Epoxy, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | ||
|---|---|---|
| OEM | ASM | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | Wafer table with wafer expander for 8” | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | ASM ADL 838 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | Uplook camera[1] | — |
| Wafer size | Wafer table with wafer expander for 8”[1] | — |
| Type | Dual Epoxy System[1] | — |
| Camera | Uplook camera[1] | — |
| Wafer table | Wafer table with wafer expander for 8-inch wafers[1] | — |
| Wafer loader | Automatic wafer loader for 8-inch wafers[1] | — |
| Ejector | Needle ejector[1] | — |
| Magazine handling | Input/Output magazine handlers[1] | — |
| Vintage | 2016[1] | — |
| Chamber Size | — | 1.2 cubic feet[2] |
| Temperature Range | — | -68°C to +180°C[2] |
| Control | — | +/-1.0°C[2] |
| Manufacturer | — | Tenney[2] |
| Model | — | JR-A-F4T[2] |
| Short description | — | Junior compact temperature test chambers[2] |
| Control accuracy | — | +/-1.0°C[2] |
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