Comparison ledger
Cascade Microtech Summit 12000 B-S, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Summit 12000 B-SCascade Microtech | |
|---|---|---|
| OEM | Cascade Microtech | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Cascade Microtech Summit 12000 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | With:[1] | — |
| Equipment type | Probe station[2] | — |
| Category | Test & Probe[2] | — |
| Included items | ADCMT 7461 A (5); ADCMT 6241 A (11); Agilent 8648 C; Keysight 34980 A; Cascade Microtech MPS 150 Probe Station; Tokyo Seimitsu EM 21 Surface Prober Tester; Tokyo Seimitsu A PM 50 A Surface PD Prober[1] | — |
| Chamber Size | — | 1.2 cubic feet[3] |
| Temperature Range | — | -68°C to +180°C[3] |
| Control | — | +/-1.0°C[3] |
| Manufacturer | — | Tenney[3] |
| Model | — | JR-A-F4T[3] |
| Short description | — | Junior compact temperature test chambers[3] |
| Control accuracy | — | +/-1.0°C[3] |
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