Comparison ledger
Cascade Microtech Summit 12000 B, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Summit 12000 BCascade Microtech | |
|---|---|---|
| OEM | Cascade Microtech | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Cascade Microtech Summit 12000 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | Agilent 8722 ES Network Analyzer[1] | — |
| Manufacturer | Cascade Microtech[2] | Tenney[3] |
| Model | Summit 12000 B[1] | JR-A-F4T[3] |
| Equipment type | Probe Station[1] | — |
| Category | Test & Probe[2] | — |
| Make | Cascade Microtech[1] | — |
| Asset type | Probe Station[1] | — |
| Associated equipment | Agilent 8722 ES Network Analyzer; Advantest R 6243 Current Sources (7); Advantest TR 6143 Current Sources (3); Agilent E 8361 A Network Analyzer; Anritsu MP 1761 B Pulse Pattern Generator; Agilent 34401 A Multimeter; Agilent 34980 A Multifunction Switch/Measure Unit[1] | — |
| Chamber Size | — | 1.2 cubic feet[3] |
| Temperature Range | — | -68°C to +180°C[3] |
| Control | — | +/-1.0°C[3] |
| Short description | — | Junior compact temperature test chambers[3] |
| Control accuracy | — | +/-1.0°C[3] |
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