Comparison ledger
Cohu Matrix II DM 8888, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | ||
|---|---|---|
| OEM | Cohu | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Cohu Matrix II DM 8888 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | JEDEC Tray[1] | — |
| Tri-Temperature test range | -40 ~175*C with LN2[1] | — |
| Temperature control range | -55*C to +175*C[1] | — |
| Air (CDA) System | 0.414 to 0.69 MPa, 566 L/min, -10*C[1] | — |
| Air (CDA), Thermal purge | 0.414 to 0.69 MPa, 340 L/min, -70*C[1] | — |
| LN2 | 0.276 to 0.483 MPa, 0.88 L/min +15% at -55*C[1] | — |
| Operating system | Windows XP[1] | — |
| Power supply | 200-240 VAC, 12.5 kVA, 3 Phase, 50/60 Hz, 30 A[1] | — |
| Make | Cohu / Delta Design[1] | — |
| Model | Matrix II / DM 8888[1] | JR-A-F4T[2] |
| Equipment type | Handler[1] | — |
| Tray / accessory | JEDEC Tray[1] | — |
| Included components | Dryer; step-down transformer[1] | — |
| Tri-temperature test range | -40 to 175°C with LN2[1] | — |
| Interface | IEEE 488.1 (GPIB); RS-232 (P849)[1] | — |
| Package types | QFP; BGA; LGA; QFN; TSOP[1] | — |
| Chamber Size | — | 1.2 cubic feet[2] |
| Temperature Range | — | -68°C to +180°C[2] |
| Control | — | +/-1.0°C[2] |
| Manufacturer | — | Tenney[2] |
| Short description | — | Junior compact temperature test chambers[2] |
| Control accuracy | — | +/-1.0°C[2] |
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