Comparison ledger
Electroglas EG 4080, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | EG 4080Electroglas | |
|---|---|---|
| OEM | Electroglas | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Electroglas EG 4080 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | DCM 4[1] | — |
| Temperature | Nickel Hot Chuck ( + 150°C )[1] | — |
| Wafer size | 8 inch[2] | — |
| Hot chuck type | Nickel[1] | — |
| Maximum hot chuck temperature | +150°C[1] | — |
| Wafer reader | IOSS 120 (Barcode, OCR)[1] | — |
| Options included | DCM 4, DPS 3[1] | — |
| Chamber Size | — | 1.2 cubic feet[3] |
| Temperature Range | — | -68°C to +180°C[3] |
| Control | — | +/-1.0°C[3] |
| Manufacturer | — | Tenney[3] |
| Model | — | JR-A-F4T[3] |
| Short description | — | Junior compact temperature test chambers[3] |
| Control accuracy | — | +/-1.0°C[3] |
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