Comparison ledger
Electroglas Horizon 4080 X, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Horizon 4080 XElectroglas | |
|---|---|---|
| OEM | Electroglas | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | 1992– | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Electroglas Horizon 4080 X | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| P/N | 704777 000[1] | — |
| OEM | Electroglas[2] | — |
| Model | Horizon 4080 X[2] | JR-A-F4T[5] |
| Equipment type | Prober[2] | — |
| Part number | 704777 000 2000 Vintage[1] | — |
| Product line | Horizon 4000 Series[3] | — |
| Make | Electroglas[2] | — |
| Last Confirm Date | February 20, 2025[2] | — |
| Part Number (P/N) | 704777 000 2000[1] | — |
| Product Type | Wafer prober[4] | — |
| Optional Feature | Bottom Probe Card Changer (BPCC)[4] | — |
| Series | Horizon 4000 Series[3] | — |
| Compatible option | Bottom Probe Card Changer (BPCC)[4] | — |
| Compatible models stated for BPCC | Horizon 4060X and Horizon 4080X wafer probers[4] | — |
| Chamber Size | — | 1.2 cubic feet[5] |
| Temperature Range | — | -68°C to +180°C[5] |
| Control | — | +/-1.0°C[5] |
| Manufacturer | — | Tenney[5] |
| Short description | — | Junior compact temperature test chambers[5] |
| Control accuracy | — | +/-1.0°C[5] |
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