Comparison ledger
Keysight 4142 Parametric Analyzer, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 4142 Parametric AnalyzerKeysight | |
|---|---|---|
| OEM | Keysight | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Keysight 4142 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | Includes the following SMU:[1] | — |
| 100V | HP41421B - includes calibration[1] | — |
| 200V | HP41420A - includes calibration[1] | — |
| HCU | HP41422A - includes calibration[1] | — |
| HVU | HP41423A - includes calibration[1] | — |
| 100V SMU | HP41421B[1] | — |
| 200V SMU | HP41420A[1] | — |
| Chamber Size | — | 1.2 cubic feet[2] |
| Temperature Range | — | -68°C to +180°C[2] |
| Control | — | +/-1.0°C[2] |
| Manufacturer | — | Tenney[2] |
| Model | — | JR-A-F4T[2] |
| Short description | — | Junior compact temperature test chambers[2] |
| Control accuracy | — | +/-1.0°C[2] |
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