Comparison ledger
Keysight M 8196 A Arbitrary Waveform, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | M 8196 A Arbitrary WaveformKeysight | |
|---|---|---|
| OEM | Keysight | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Keysight M 8196 A Arbitrary Waveform | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | 92Gsa/S, Dual Channel[1] | — |
| Instrument type | Arbitrary waveform generator[2] | — |
| Sample rate | Up to 92 GSa/s[3] | — |
| Analog bandwidth | 32 GHz typical[3] | — |
| Vertical resolution | 8 bits[3] | — |
| Waveform memory | 512 kSa per channel[3] | — |
| Channel count | 1, 2, or 4 differential channels per 1-slot AXIe module[3] | — |
| Chamber Size | — | 1.2 cubic feet[4] |
| Temperature Range | — | -68°C to +180°C[4] |
| Control | — | +/-1.0°C[4] |
| Manufacturer | — | Tenney[4] |
| Model | — | JR-A-F4T[4] |
| Short description | — | Junior compact temperature test chambers[4] |
| Control accuracy | — | +/-1.0°C[4] |
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