Comparison ledger
Keysight Medalist 3070 Series 5 ICT, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Medalist 3070 Series 5 ICTKeysight | |
|---|---|---|
| OEM | Keysight | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Keysight Medalist | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| DS7i | 520782[1] | — |
| Configuration | Windows 10[1] | — |
| Software Version | Keysight i3070 09.20pc 0418 WN[1] | — |
| Control Card Revision | XT[1] | — |
| ASRU Revision | C[1] | — |
| Pincards | 3[1] | — |
| Active Modules | 1[1] | — |
| License | 6 MHz[1] | — |
| Size | 2 bank[1] | — |
| Make | Keysight / Agilent[1] | — |
| Product type | In-circuit tester[2] | — |
| Operating system | Windows 10[1] | — |
| Vintage | 2008[1] | — |
| Chamber Size | — | 1.2 cubic feet[3] |
| Temperature Range | — | -68°C to +180°C[3] |
| Control | — | +/-1.0°C[3] |
| Manufacturer | — | Tenney[3] |
| Model | — | JR-A-F4T[3] |
| Short description | — | Junior compact temperature test chambers[3] |
| Control accuracy | — | +/-1.0°C[3] |
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