Comparison ledger
KLA 1.112 PSL Wafer, Rigaku Smax 3000 Small Angle X-ray Scattering, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | ||
|---|---|---|
| OEM | KLA | Rigaku |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1.112 PSL Wafer | Rigaku Smax 3000 Small Angle X-ray Scattering |
| Specifications | ||
| Configuration | NIST Traceable[1] | System was recently upgraded with a new Xenocs detector[3] |
| Wafer Size | 8 inch[1] | — |
| NIST Traceable | True[1] | — |
| Compatible Tools | Surfscan 6xy0 and Sp1[2] | — |
| Type | — | small-angle X-ray scattering (SAXS) system[4] |
| X-ray generation | — | X-rays can be generated[4] |
| Anode | — | rotating copper anode[3] |
| Detector upgrade | — | recently upgraded with a new Xenocs detector[3] |
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