Comparison ledger
KLA 2132 Brightfield and KLA 5100 Overlay Measurement, side by side. Every value shown is drawn from its cited encyclopedia entry.
| Attribute | ||
|---|---|---|
| OEM | KLA | KLA |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 21xx | KLA 5100 |
| Specifications | ||
| Configuration | Main body only[1] | Windows NT / VAX software[2] |
| OS | — | VMS[2] |
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