Comparison ledger
KLA .498 PSL Wafer, Onto Innovation NanoSpec 8000 X Film Thickness Measurement, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | NanoSpec 8000 X Film Thickness MeasurementOnto Innovation | |
|---|---|---|
| OEM | KLA | Onto Innovation |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA .498 PSL Wafer | Onto Innovation NanoSpec 8000 X Film Thickness Measurement |
| Specifications | ||
| Configuration | NIST Traceable[1] | — |
| NIST traceability | Yes[1] | — |
| OEM | KLA[1] | Onto / Nanometrics[2] |
| Category | Metrology & Inspection[1] | — |
| Traceability | Yes[1] | — |
| Description | Particle-sizing calibration standard[1] | — |
| Model | — | NanoSpec 8000 X[2] |
| Equipment type | — | Film thickness measurement system[2] |
| Wafer size | — | 6 inch[3] |
Plan your fab
Building a Metrology & Inspection process? Get a complete equipment list.
Open the fab equipment planner →