Comparison ledger
KLA .498 PSL Wafer, Tektronix TDS 6604 Digital Storage Oscilloscope, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | ||
|---|---|---|
| OEM | KLA | Tektronix |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA .498 PSL Wafer | Tektronix TDS |
| Specifications | ||
| Configuration | NIST Traceable[1] | 6 GHz, 20GS/s[2] |
| NIST traceability | Yes[1] | — |
| OEM | KLA[1] | Tektronix[3] |
| Category | Metrology & Inspection[1] | — |
| Traceability | Yes[1] | — |
| Description | Particle-sizing calibration standard[1] | — |
| Firmware Version | — | 2.5.3[2] |
| Operating System | — | Windows 98 SE[2] |
| Bandwidth | — | 6 GHz[3] |
| Sampling rate | — | 20 GS/s[3] |
| Options | — | JT3 - Jitter Analysis 3; JA3 - Jitter Analysis - Advanced[2] |
| Instrument type | — | Digital storage oscilloscope[3] |
| Option | — | JT3 - Jitter Analysis 3[2] |
| Model | — | TDS 6604[3] |
| Equipment type | — | Digital Storage Oscilloscope[2] |
| Test status | — | Tested and working; passes self test and SPC calibration; all channels tested up to 3 GHz and working[2] |
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