Waferpedia

Comparison ledger

.498 PSL WaferversusNewview 100 Optical Surface

KLA .498 PSL Wafer, Zygo Newview 100 Optical Surface, side by side. Every value shown is drawn from the cited encyclopedia entries.

LinkedIn X Email
Side-by-side comparison of selected equipment models
Attribute
.498 PSL WaferKLA
Newview 100 Optical SurfaceZygo
OEMKLAZygo
CategoryMetrology & InspectionMetrology & Inspection
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyKLA .498 PSL WaferZygo Newview
Specifications
ConfigurationNIST Traceable[1]40x objective[2]
NIST traceabilityYes[1]—
Manufacturer—Zygo[2]
Model—Newview 100[2]
Type—Optical Surface Profilometer[2]
Objectives—40x objective, 10x objectives[2]
Software—Metro-pro software[2]
Vintage—1996[2]
.498 PSL Wafer entryNewview 100 Optical Surface entryAsk about these tools →Share experience with this comparison →

Plan your fab

Building a Metrology & Inspection process? Get a complete equipment list.

Open the fab equipment planner →
Sources (2)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]inventory listing