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AIT II Defect versus Prometrix UV 1250 SE Film Thickness Measurement

KLA AIT II Defect and KLA Prometrix UV 1250 SE Film Thickness Measurement, side by side. Every value shown is drawn from its cited encyclopedia entry.

Side-by-side comparison of selected equipment models
Attribute
OEMKLAKLA
CategoryMetrology & InspectionMetrology & Inspection
Wafer size
Process node
Introduced
Production run
Lifecycle
Lifecycle milestones
Control system
Generation
FamilyKLA AITKLA UV 1250 SE
Specifications
Software Version5.3.20.4[1]2.4[2]
CIMSECS, GEM[1]
Handler SystemDual[1]
Factory InterfaceOpen Cassette[1]
Phase1 Phase[2]
Configuration120 Volt[2]
Robot TypeKLA H2D[2]

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Sources (2)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]inventory listing