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Archer XT+ Overlay Measurement versus UV 1280 SE Thin Film Thickness Measurement

KLA Archer XT+ Overlay Measurement and KLA UV 1280 SE Thin Film Thickness Measurement, side by side. Every value shown is drawn from its cited encyclopedia entry.

Side-by-side comparison of selected equipment models
Attribute
OEMKLAKLA
CategoryMetrology & InspectionMetrology & Inspection
Wafer size
Process node
Introduced
Production run
Lifecycle
Lifecycle milestones
Control system
Generation
FamilyKLA ArcherKLA UV 1280 SE Thin Film Thickness Measurement
Specifications
Software version5.60[1]
ConfigurationNew / Refurbished Items:[1]Single phase[2]
New system consumable partsShutter, HLS Lamp & Air Filters[1]
Voltage200 V[2]
Power1.8 kW[2]

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Sources (2)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]inventory listing