Waferpedia

Comparison ledger

P 17 Surface versus UV 1280 SE Thin Film Thickness Measurement

KLA P 17 Surface and KLA UV 1280 SE Thin Film Thickness Measurement, side by side. Every value shown is drawn from its cited encyclopedia entry.

LinkedIn X Email
Side-by-side comparison of selected equipment models
Attribute
P 17 SurfaceKLA
UV 1280 SE Thin Film Thickness MeasurementKLA
OEMKLAKLA
CategoryMetrology & InspectionMetrology & Inspection
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyKLA PKLA UV 1280 SE Thin Film Thickness Measurement
Specifications
Phase1 Phase[1]—
Configuration50/60 Hz[1]Single phase[3]
Voltage—200 V[3]
Power—1.8 kW[3]
P 17 Surface entryUV 1280 SE Thin Film Thickness Measurement entry

Plan your fab

Building a Metrology & Inspection process? Get a complete equipment list.

Open the fab equipment planner →
Sources (3)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]inventory listing
  3. [3]inventory listing