Waferpedia

Comparison ledger

P-2versusP 22 H Surface

KLA P-2, KLA P 22 H Surface, side by side. Every value shown is drawn from the cited encyclopedia entries.

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Side-by-side comparison of selected equipment models
Attribute
P-2KLA
OEMKLAKLA
CategoryMetrology & InspectionMetrology & Inspection
Wafer size200mmAutomated Wafer Handler
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyKLA P-2KLA P
Specifications
ModelP-2[1]—
OEMKLA Tencor[1]—
Equipment typeProfilometer[1]Surface profilometer[4]
Sample table200 mm sample table with vacuum[2]—
Measurement rangeMeasures steps from 100 Å to 300 µm[2]—
Maximum sample thickness20 mm[2]21 mm[4]
Minimum sample length25 mm[2]—
Feature3D scan option[2]—
Wafer size200mm[3]Automated Wafer Handler[4]
3D scan optionYes[2]—
Configuration—Step Height Precision Micro 2D Scanner[4]
Scan Length—60 mm[4]
Scan Speed—1 um/sec to 25mm/ sec[4]
Scan Method—Bi-directional moving stylus[4]
Sampling Rate—5, 10, 20, 50, 100, 200, 500 , 1000 Hz[4]
Stylus Force—Adjustable between 0.05 ~ 50mg[4]
Step Height Repeatability, 1—0.75 nm or 0.1%:Sample Handling:[4]
Theta—360[4]
Optics—Dual View Optics[4]
Stage—Motorized precision 200mm Diameter X-Y vacuum sample stage[4]
Stylus—2 um Radius 60[4]
Operating system—Window based Operation system[4]
Monitor—LCD Monitor[4]
Vertical Range / Resolution—+,- 13um/0.0075A +,-65um/0.04A 327um/0.19A[4]
Step Height Repeatability—0.75 nm or 0.1%[4]
Theta rotation—360[4]
Maximum sample weight—1 Kg[4]
Automated Wafer Handler—1 open loadport for 200mm and 150mm[4]
Data Screen—display scan, roughness, data summary table listing up to 27 parameters ( total 48 )[4]
Database Manager—Save & Retrieve data[4]
ASCII Output—Scan data is exportable to commercial spreadsheet programs[4]
Data Output—Data Screen (display scan, roughness, data summary table listing up to 27 parameters total 48), Database Manager, ASCII Output[4]
Performance—Step Height Precision Micro 2D Scanner[5]
Data output—Data Screen, Database Manager, ASCII Output[4]

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Sources (5)Every fact above is drawn from these public sources
  1. [1]nanofab.ece.cmu.edunanofab.ece.cmu.edu
  2. [2]nanofab.ece.cmu.edunanofab.ece.cmu.edu
  3. [3]waferpedia.comwaferpedia.com
  4. [4]inventory listing
  5. [5]waferpedia.comwaferpedia.com