Waferpedia

Comparison ledger

PN: 29 0177 Window, Lamp House versus Surfscan SP 3 Particle Defect

KLA PN: 29 0177 Window, Lamp House and KLA Surfscan SP 3 Particle Defect, side by side. Every value shown is drawn from its cited encyclopedia entry.

Side-by-side comparison of selected equipment models
Attribute
OEMKLAKLA
CategoryMetrology & InspectionMetrology & Inspection
Wafer sizeBare wafer inspection station
Process node
Introduced
Production run
Lifecycle
Lifecycle milestones
Control system
Generation
FamilyKLA PN: 29 0177 Window, Lamp HouseKLA Surfscan
Specifications
ConfigurationFused Silica[1]HDD not included[2]
Wafer sizeBare wafer inspection station[2]

Plan your fab

Building a Metrology & Inspection process? Get a complete equipment list.

Open the fab equipment planner →
Sources (2)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]inventory listing