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Prometrix UV 1250 SE Film Thickness Measurement versus Surfscan SP 5 Particle Defect

KLA Prometrix UV 1250 SE Film Thickness Measurement and KLA Surfscan SP 5 Particle Defect, side by side. Every value shown is drawn from its cited encyclopedia entry.

Side-by-side comparison of selected equipment models
Attribute
OEMKLAKLA
CategoryMetrology & InspectionMetrology & Inspection
Wafer sizeBare Wafer Inspection Station
Process node
Introduced
Production run
Lifecycle
Lifecycle milestones
Control system
Generation
FamilyKLA UV 1250 SEKLA Surfscan
Specifications
Phase1 Phase[1]
Configuration120 Volt[1]Integrated Console[2]
Software Version2.4[1]
Robot TypeKLA H2D[1]
Wafer sizeBare Wafer Inspection Station[2]

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Sources (2)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]inventory listing