Waferpedia

Comparison ledger

Solid State versus UV 1280 SE Thin Film Thickness Measurement

KLA Solid State and KLA UV 1280 SE Thin Film Thickness Measurement, side by side. Every value shown is drawn from its cited encyclopedia entry.

Side-by-side comparison of selected equipment models
Attribute
OEMKLAKLA
CategoryMetrology & InspectionMetrology & Inspection
Wafer size
Process node
Introduced
Production run
Lifecycle
Lifecycle milestones
Control system
Generation
FamilyKLA Solid StateKLA UV 1280 SE Thin Film Thickness Measurement
Specifications
ConfigurationUpgrade for KLA AIT II & XP Series Systems[1]Single phase[2]
Voltage200 V[2]
Power1.8 kW[2]

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Sources (2)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]inventory listing