Waferpedia

Comparison ledger

Starlight 301 300 SL Inspection Measurement versus UV 1280 SE Thin Film Thickness Measurement

KLA Starlight 301 300 SL Inspection Measurement and KLA UV 1280 SE Thin Film Thickness Measurement, side by side. Every value shown is drawn from its cited encyclopedia entry.

LinkedIn X Email
Side-by-side comparison of selected equipment models
Attribute
Starlight 301 300 SL Inspection MeasurementKLA
UV 1280 SE Thin Film Thickness MeasurementKLA
OEMKLAKLA
CategoryMetrology & InspectionMetrology & Inspection
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyKLA Starlight 301 300 SL Inspection MeasurementKLA UV 1280 SE Thin Film Thickness Measurement
Specifications
Voltage208 Vac[1]200 V[2]
Configuration50/60 Hz[1]Single phase[2]
Power—1.8 kW[2]
Starlight 301 300 SL Inspection Measurement entryUV 1280 SE Thin Film Thickness Measurement entry

Plan your fab

Building a Metrology & Inspection process? Get a complete equipment list.

Open the fab equipment planner →
Sources (2)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]inventory listing