Waferpedia

Comparison ledger

Surfscan SP 3 Particle Defect versus Tera Stay SLF 27 Reticle

KLA Surfscan SP 3 Particle Defect and KLA Tera Stay SLF 27 Reticle, side by side. Every value shown is drawn from its cited encyclopedia entry.

Side-by-side comparison of selected equipment models
Attribute
OEMKLAKLA
CategoryMetrology & InspectionMetrology & Inspection
Wafer sizeBare wafer inspection station
Process node
Introduced
Production run
Lifecycle
Lifecycle milestones
Control system
Generation
FamilyKLA SurfscanKLA SLF
Specifications
ConfigurationHDD not included[1]1 Reticle loader[2]
Wafer sizeBare wafer inspection station[1]

Plan your fab

Building a Metrology & Inspection process? Get a complete equipment list.

Open the fab equipment planner →
Sources (2)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]inventory listing