Comparison ledger
LTX-Credence ASLx, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | ASLxLTX-Credence | |
|---|---|---|
| OEM | LTX-Credence | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | LTX-Credence ASLx | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | Keyboard / monitor[1] | — |
| Slot 1 | Source Sync Step Bus II Interface (SSB1)[1] | — |
| Slot 3 | MUX (Metal relays)[1] | — |
| Slot 15 | HVS[1] | — |
| Slot 24/20 | Pocket MUX[1] | — |
| Slot PP | Pocket Power Board[1] | — |
| Machine type | Tester[1] | — |
| Instrument adaptor boards | 6[1] | — |
| Board compatibility | Standard ASL-1000 boards[1] | — |
| Agilent meter | One tester with Agilent Meter; one tester without[1] | — |
| Vintage | 2014[1] | — |
| Chamber Size | — | 1.2 cubic feet[2] |
| Temperature Range | — | -68°C to +180°C[2] |
| Control | — | +/-1.0°C[2] |
| Manufacturer | — | Tenney[2] |
| Model | — | JR-A-F4T[2] |
| Short description | — | Junior compact temperature test chambers[2] |
| Control accuracy | — | +/-1.0°C[2] |
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